Daniel Hansson and Patrik Granath from Verifyter were awarded "Best Poster - 2nd Place" at DVCon US, San Jose, for the poster with the title "Automatic Debug Down to the Line of Code". The poster explained how to automatically debug regression failures down to exact line of code that causes a test to fail. In the photo below, the award is announced by Tom FitzPatrick (to the right), Technical Program Chair at DVCon US and Verification Technologist at Mentor Graphics. Daniel Hansson (to the left) from Verifyter humbly accepts it.

Getting the award

 Poster session

 The poster

At DVCon US 2017 in San Jose Verifyter announced that 3 of the largest 5 semiconductor companies are now using PinDown to automate debug of regression failures. There was a lot of traffic at the booth where we demoed the latest version of PinDown which can automatically debug regression failures down to the exact line of code that is causing it.

Presented "Automatic Debug with File Granularity" at Microprocessor Test/SoC and Verification, 13th Dec 2016, Austin, Texas. Among the many interesting presentations especially one stood out: Harry Foster's 2016 Functional Verification Study. He said that 39% of verification engineers' time consisted of debug according to the study.